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Spurious emission search with spectrum analyzers is one of the most demanding measurements in the design, verification and production of RF and microwave devices. RF designers, especially in the aerospace & defense industry need to detect very low level spurs. Very narrow resolution bandwidths are required to measure with a low noise floor, hence increasing measurement time. Even working with very fast spectrum analyzers, a spur search may take several hours or even days.
In this paper we will review the basics of spurious measurements and how the parameters used can affect the detection performance. A new technique as used in the R&S®FSW-K50 spurious measurement application which makes spurious search faster and easier to configure.

References:

http://www.rohde-schwarz.com/ua/applications/advanced-techniques-for-spurious-measurements-with-r-s-fsw-k50-white-paper_230854-454016.html
http://www.masterclass.com/articles/22-essential-literary-devices

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